A complete analysis of the laser beam deflection systems used in cantilever-based systems-Reference-Cited by-同舟云学术

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A complete analysis of the laser beam deflection systems used in cantilever-based systems

Published:2007-04 Issue:4-5 Volume:107 Page:422-430
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Beaulieu L.Y.,Godin Michel,Laroche Olivier,Tabard-Cossa Vincent,Grütter Peter

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference21 articles.

1. Fabrication and characterization of nanoresonating devices for mass detection

2. Surface Stress in the Self-Assembly of Alkanethiols on Gold

3. Erratum: Novel optical approach to atomic force microscopy [Appl. Phys. Lett. 53, 1045 (1988)]

4. A detailed analysis of the optical beam deflection technique for use in atomic force microscopy

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