Erratum: Novel optical approach to atomic force microscopy [Appl. Phys. Lett. 5 3, 1045 (1988)]
Author:
Affiliation:
1. IBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598
Publisher
AIP Publishing
Link
https://pubs.aip.org/aip/apl/article-pdf/53/24/2400/18468806/2400_1_online.pdf
Reference14 articles.
1. Atomic Force Microscope
2. Atomic force microscope–force mapping and profiling on a sub 100-Å scale
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