1. M.E. Mason, VLSI Technology Digest, 2007, p. 90.
2. H. Onodera, VLSI Technology Digest, 2007, p. 92.
3. T. Tsunomura, A. Nishida, F. Yano, A.T. Putra, K. Takeuchi, S. Inaba, S. Kamohara, K. Terada, T. Hiramoto, T. Mogami, VLSI Technology Digest, 2008, p. 156.
4. Origin of the Asymmetry in the Magnitude of the Statistical Variability of n- and p-Channel Poly-Si Gate Bulk MOSFETs
5. Atom probe tomography