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Advanced thin film technology for ultrahigh resolution X-ray microscopy

  • Published:2009-10 Issue:11 Volume:109 Page:1360-1364
  • ISSN:0304-3991
  • Container-title:Ultramicroscopy
  • language:en
  • Short-container-title:Ultramicroscopy

Author:

Vila-Comamala Joan,Jefimovs Konstantins,Raabe Jörg,Pilvi Tero,Fink Rainer H.,Senoner Mathias,Maaßdorf Andre,Ritala Mikko,David Christian

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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