Simulation of scanning transmission electron microscope images on desktop computers
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference31 articles.
1. Incoherent imaging of zone axis crystals with ADF STEM
2. An approach to quantitative compositional profiling at near-atomic resolution using high-angle annular dark field imaging
3. Atomic-resolution annular dark-field STEM image calculations
4. Atomic-resolution quantitative composition analysis using scanning transmission electron microscopy Z-contrast experiments
5. Influence of the static atomic displacement on atomic resolution Z-contrast imaging
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