Author:
Rudnaya M.E.,Van den Broek W.,Doornbos R.M.P.,Mattheij R.M.M.,Maubach J.M.L.
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference38 articles.
1. Three-dimensional localization of ultrasmall immuno-gold labels by HAADF-STEM tomography;Ziese;J. Struct. Biol.,2002
2. Three-dimensional STEM for observing nanostructures;Koguchi;J. Electron Microsc.,2001
3. Critical dimension monitoring with STEM in thin film magnetic head wafer production;Wang;Microsc. Microanal.,2008
4. W. Van den Broek, Advanced focus methods in electron microscopy: tomographic reconstruction of the EELS data cube autofocus of HAADF-STEM images, Ph.D. Thesis, University of Antwerp, 2007.
5. An on-linea correction method of defocus and astigmatism in HAADF-STEM;Tanaka;Ultramicroscopy,1999
Cited by
13 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献