Generalized spot auto-focusing method with a high-definition auto-correlation function in transmission electron microscopy

Author:

Isakozawa Shigeto1,Baba Misuzu1,Amano Junpei2,Sakamoto Shohei2,Baba Norio2

Affiliation:

1. Research Institute for Science and Technology, Kogakuin University, 2665-1 Nakano, Hachioji, Tokyo 192-0015, Japan

2. Major of Informatics, Graduate School, Kogakuin University, 2665-1 Nakano, Hachioji, Tokyo 192-0015, Japan

Abstract

Abstract The spot auto-focusing (AF) method with a unique high-definition auto-correlation function (HD-ACF) proposed in the previous paper is improved and is now applicable to general specimens at a wide range of magnifications. According to the definition where the AF is defocused to obtain the highest resolution, the proposed method achieves the sharpest HD-ACF profile in the AF spot image. The relationship where the sharpest HD-ACF profile gives the highest resolution is theoretically explained, and practical AF examples for different specimens and magnifications are experimentally demonstrated. Specimens include a yeast cell thin section at 10-k magnification, a standard grating replica used as a ruler at 50-k, a crystal lattice of graphitized carbon at 400-k and a 60°-tilted thin section (yeast cell) at 10-k. Different procedures are prepared to actively identify the defocus position that gives the sharpest HD-ACF profile. Every AF result demonstrates the highest-resolution image.

Funder

Promotion of Science Grants-in-Aid for Scientific Research

Publisher

Oxford University Press (OUP)

Subject

Radiology, Nuclear Medicine and imaging,Instrumentation,Structural Biology

Reference21 articles.

1. Spot auto-focusing and spot auto-stigmation methods with high-definition auto-correlation function in high-resolution TEM;Isakozawa;Microscopy,2018

2. High-precision image-drift-correction method for EM images with a low signal-to-noise ratio;Isakozawa;Microscopy,2014

3. The correlation averaging of a regularly arranged bacterial cell envelope protein;Saxton;J Microsc.,1982

4. Detection of objectives in quantum-noise limited images;Van Heel;Ultramicroscopy,1982

5. Three-fold astigmatism in high-resolution transmission electron microscopy;Krivanek;Ultramicroscopy,1994

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3