Local estimation of lattice constants in HRTEM images
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference23 articles.
1. Composition evaluation by lattice fringe analysis
2. Direct compositional analysis of AlGaAs/GaAs heterostructures by the reciprocal space segmentation of high-resolution micrographs
3. Direct measurement of local lattice distortions in strained layer structures by HREM
4. Strain mapping of ultrathin epitaxial ZnTe and MnTe layers embedded in CdTe
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