Effect of sample thickness, energy filtering, and probe coherence on fluctuation electron microscopy experiments
Author:
Funder
U.S. National Science Foundation
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference26 articles.
1. Variable Coherence Microscopy: a Rich Source of Structural Information from Disordered Materials
2. Medium-range order in amorphous silicon measured by fluctuation electron microscopy
3. Increased medium-range order in amorphous silicon with increased substrate temperature
4. Nanometer-scale order in amorphous Ge2Sb2Te5 analyzed by fluctuation electron microscopy
5. Aluminum nanoscale order in amorphous Al92Sm8 measured by fluctuation electron microscopy
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