Fast reconstruction of atomic-scale STEM-EELS images from sparse sampling-Reference-Cited by-同舟云学术

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Fast reconstruction of atomic-scale STEM-EELS images from sparse sampling

Published:2020-08 Issue: Volume:215 Page:112993
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Monier Etienne,Oberlin Thomas,Brun Nathalie,Li Xiaoyan,Tencé Marcel,Dobigeon Nicolas

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference60 articles.

1. Reconstruction of partially sampled STEM-EELS images with atomic resolution;Monier,2019

2. Radiation damage in the TEM and SEM;Egerton;Micron,2004

3. Spatial and spectral dynamics in stem hyperspectral imaging using random scan patterns;Zobelli;Ultramicroscopy,2019

4. Sparse imaging for fast electron microscopy;Anderson,2013

5. Compressed sensing and electron microscopy;Binev,2012

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