Denoising atomic resolution 4D scanning transmission electron microscopy data with tensor singular value decomposition-Reference-Cited by-同舟云学术

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Denoising atomic resolution 4D scanning transmission electron microscopy data with tensor singular value decomposition

Published:2020-12 Issue: Volume:219 Page:113123
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Zhang Chenyu,Han Rungang,Zhang Anru R.,Voyles Paul.M.

Funder

National Science Foundation

National Institutes of Health

U.S. Department of Energy

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference69 articles.

1. Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): from scanning nanodiffraction to ptychography and beyond;Ophus;Microsc. Microanal.,2019

2. Fast Pixelated Detectors in Scanning Transmission Electron Microscopy. Part I: Data Acquisition, Live Processing, and Storage;Nord;Microscopy and Microanalysis,2020

3. Phase reconstruction using fast binary 4D STEM data;O’Leary;Applied Physics Letters,2020

4. Sub-100 nanosecond temporally resolved imaging with the Medipix3 direct electron detector;Paterson;Ultramicroscopy,2020

5. Electron counting and beam-induced motion correction enable near-atomic-resolution single-particle cryo-EM;Li;Nat. Methods,2013

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