The exit-wave power-cepstrum transform for scanning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision-Reference-Cited by-同舟云学术

The exit-wave power-cepstrum transform for scanning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision

Published:2020-07 Issue: Volume:214 Page:112994
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Padgett Elliot,Holtz Megan E.,Cueva Paul,Shao Yu-Tsun,Langenberg Eric,Schlom Darrell G.,Muller David A.

Funder

Air Force Office of Scientific Research

U.S. Department of Energy

National Science Foundation

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference44 articles.

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5. Medipix2 as a highly flexible scanning/imaging detector for transmission electron microscopy;Mac Raighne;J. Instrum,2011

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