A statistical analysis of the variation in measured crystal orientations obtained through electron backscatter diffraction
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference15 articles.
1. Modeling and inference for measured crystal orientations and a tractable class of symmetric distributions for rotations in 3 dimensions;Bingham;Journal of the American Statistical Association,2009
2. Studies on the accuracy of electron backscatter diffraction measurements;Demirel,2000
3. Application of orientation imaging microscopy to study phase transformations in steels;Wilson;Materials Characterization,2001
4. A new method for determining small misorientations from electron back scatter diffraction patterns;Wilkinson;Scripta Materialia,2001
5. High-resolution elastic strain measurement from electron backscatter diffraction patterns: new levels of sensitivity;Wilkinson;Ultramicroscopy,2006
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