Double aberration correction in a low-energy electron microscope-Reference-Cited by-同舟云学术

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Double aberration correction in a low-energy electron microscope

Published:2010-10 Issue:11 Volume:110 Page:1358-1361
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Schmidt Th.,Marchetto H.,Lévesque P.L.,Groh U.,Maier F.,Preikszas D.,Hartel P.,Spehr R.,Lilienkamp G.,Engel W.,Fink R.,Bauer E.,Rose H.,Umbach E.,Freund H.-J.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference40 articles.

1. Low energy electron microscopy

2. LEEM and SPLEEM;Bauer,2007

3. Recent advances in chemical and magnetic imaging of surfaces and interfaces by XPEEM

4. SPELEEM: Combining LEEM and Spectroscopic Imaging

5. Growth dynamics of pentacene thin films

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