Author:
Salmons Brian S.,Katz Daniel R.,Trawick Matthew L.
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference22 articles.
1. Optical scan-correction system applied to atomic force microscopy;Barrett;Rev. Sci. Instrum.,1991
2. Correction for piezoelectric creep in scanning probe microscopy images using polynomial mapping;Trawick;Scanning,2003
3. Correction for thermal drift in scanning probe microscopy using polynomial mapping;Katz;Bull. Am. Phys. Soc.,2005
4. A technique for removing distortion due to thermal drift in scanning probe microscope images;Salmons;Bull. Am. Phys. Soc.,2007
5. Automatic drift elimination in probe microscope images based on techniques of counter-scanning and topography feature recognition;Lapshin;Meas. Sci. Technol.,2007
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