Shaping the lens of the atom probe: Fabrication of site specific, oriented specimens and application to grain boundary analysis
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference26 articles.
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5. A controlled specimen preparation technique for interface studies with atom-probe field-ion microscopy
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3. A more holistic characterisation of internal interfaces in a variety of materials via complementary use of transmission Kikuchi diffraction and Atom probe tomography;Applied Surface Science;2020-10
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