Correlative Site-Specific Sample Preparation for Atom Probe Tomography on Complex Microstructures-Reference-Cited by-同舟云学术

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Correlative Site-Specific Sample Preparation for Atom Probe Tomography on Complex Microstructures

Published:2021-06-03 Issue: Volume: Page:1-10
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:Microsc Microanal

Author:

Campo Schneider Lucía Paula^ORCID,Barrirero Jenifer,Pauly Christoph,Guitar Agustina,Mücklich Frank

Abstract

Publisher

Cambridge University Press (CUP)

Subject

Instrumentation

Reference46 articles.

1. Radiation damage in the TEM and SEM

2. Quantification of carbon contamination under electron beam irradiation in a scanning transmission electron microscope and its suppression by plasma cleaning;Griffiths;J Phys: Conf Ser,2010

3. Morphology, substructure and crystallography of lath martensite in Fe-C alloys;Furuhara;J Phys, IV,2003

4. Atom probe trajectory mapping using experimental tip shape measurements

5. A reproducible method for damage-free site-specific preparation of atom probe tips from interfaces

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