Extraction of EELS white-line intensities of manganese compounds: Methods, accuracy, and valence sensitivity
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference29 articles.
1. Transmission Electron Microscopy;Williams,1996
2. Electron Energy-Loss Spectroscopy in the Electron Microscope;Egerton,1996
3. EELS analysis of cation valence states and oxygen vacancies in magnetic oxides
4. Elnes of 3d transition-metal oxides
5. Determination of manganese oxidation states in solids by electron energy-loss spectroscopy
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