Theoretical discussions on the geometrical phase analysis
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference11 articles.
1. Extracting Quantitative Information from High Resolution Electron Microscopy
2. Quantitative characterization of GaN quantum-dot structures in AlN by high-resolution transmission electron microscopy
3. Crystallographic heterodyne phase detection for highly sensitive lattice-distortion measurements
4. Quantitative measurement of displacement and strain fields from HREM micrographs
5. Measurement of the displacement field of dislocations to 0.03 Å by electron microscopy
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