Atomic scale characterization of point and extended defects in niobate thin films-Reference-Cited by-同舟云学术

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Atomic scale characterization of point and extended defects in niobate thin films

Published:2019-08 Issue: Volume:203 Page:82-87
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Li Changjian,Song Dongsheng,Li Mengsha,Tang Chunhua,Xue Deqing,Wan Dongyang,Pennycook Stephen J.

Funder

Ministry of Education

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference26 articles.

1. Niobium oxides and niobates physical properties: review and prospects;Nico;Prog. Mater Sci.,2016

2. Antiferromagnetism and metallic conductivity in Nb12O29;Cava;Nature,1991

3. Electrochemical lithium intercalation in monoclinic Nb12O29;Li;Chem. Mater.,2011

4. An n-type transparent conducting oxide: Nb12O29;Ohsawa;J. Phys. Chem. C,2011

5. Structures of the reduced niobium oxides Nb12O29 and Nb22O54;McQueen;J. Solid State Chem.,2007

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1. The atomic configuration and metallic state of extrinsic defects in Nb-doped BiFeO3 thin films;Acta Materialia;2024-07

2. Epitaxial conducting ABO3 perovskite oxide thin films;Journal of Applied Physics;2023-06-22

3. Metallic line defect in wide-bandgap transparent perovskite BaSnO 3;Science Advances;2021-01-15

4. Sputtered SrxNbO3 as a UV-Transparent Conducting Film;ACS Applied Materials & Interfaces;2020-06-09

5. Electronic and plasmonic phenomena at nonstoichiometric grain boundaries in metallic SrNbO3;Nanoscale;2020

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