1. A.B. Sproul, S.A. Edmiston, T. Puzzer, G. Heiser, S.R. Wenham, M.A. Green, T.L. Young, in: Proceedings of the 25th IEEE Photovoltaics Specialists Conference, Washington, DC, USA, May 13–17, 1996, p. 549.
2. Determination of diffusion length from within a confined region with the use of EBIC
3. Locally delineating of junctions and defects by local cross-section electron-beam-induced-current technique
4. R. Heiderfoff, R.M. Cramer, L.J. Balk, in: IEEE International Reliability Physics Proceedings, 34th Annual IEEE, Catalog No. 96CH35825, 1996, p. 366.
5. Scanning near-field cathodoluminescence microscopy