Author:
Kindt Johannes H,Fantner Georg E,Cutroni Jackie A,Hansma Paul K
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference9 articles.
1. Atomic Force Microscope
2. Atomic Force Microscopy
3. Atomic resolution with the atomic force microscope on conductors and nonconductors
4. G. Schitter, F. Allgoewer, Robust 2DOF-control of a piezoelectric tube scanner for high speed atomic force microscopy. Proceedings of the American Control Conference, Denver, CO, June 4–6, 2003, pp. 3720–3725.
5. Short cantilevers for atomic force microscopy
Cited by
99 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献