Reproducible lateral force microscopy measurements for quantitative comparisons of the frictional and chemical properties of nanostructures
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference27 articles.
1. Atomic-scale friction of a tungsten tip on a graphite surface
2. Simultaneous measurement of lateral and normal forces with an optical‐beam‐deflection atomic force microscope
3. "Dip-Pen" Nanolithography
4. Influence of capillary condensation of water on nanotribology studied by force microscopy
5. Low-load friction behavior of epitaxialC60monolayers under Hertzian contact
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