Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy-Reference-Cited by-同舟云学术

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Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy

Published:2014-02 Issue: Volume:137 Page:12-19
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Martinez G.T.,Rosenauer A.,De Backer A.,Verbeeck J.,Van Aert S.

Funder

Research Foundation Flanders (FWO, Belgium)

European Research Council under the 7th Framework Program (FP7)

DFG

European Union 7th Framework Programme

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference31 articles.

1. Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy;Van Aert;Ultramicroscopy,2009

2. High-resolution Z-contrast imaging of crystals;Pennycook;Ultramicroscopy,1991

3. Advanced Computing in Electron Microscopy;Kirkland,1998

4. Multislice simulation of high-resolution scanning transmission electron microscopy Z-contrast images of semiconductor heterointerfaces;Bollig;Scanning,1996

5. A practical approach for STEM image simulation based on the FFT multislice method;Ishizuka;Ultramicroscopy,2002

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