Ranking TEM cameras by their response to electron shot noise-Reference-Cited by-同舟云学术

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Ranking TEM cameras by their response to electron shot noise

Published:2013-10 Issue: Volume:133 Page:1-7
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Grob Patricia,Bean Derek,Typke Dieter,Li Xueming,Nogales Eva,Glaeser Robert M.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference13 articles.

1. Characterisation of the signal and noise transfer of CCD cameras for electron detection;Meyer;Microscopy Research and Technique,2000

2. Experimental characterisation of CCD cameras for HREM at 300kV;Meyer;Ultramicroscopy,2000

3. The effects of electron and photon scattering on signal and noise transfer properties of scintillators in CCD cameras used for electron detection;Meyer;Ultramicroscopy,1998

4. Detective quantum efficiency of electron area detectors in electron microscopy;McMullan;Ultramicroscopy,2009

5. Fully automated measurement of the modulation transfer function of charge–coupled devices above the nyquist frequency;Van den Broek;Microscopy and Microanalysis,2012

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