A new TCAD simulation method for direct CMOS electron detectors optimization
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference28 articles.
1. A monolithic active pixel sensor for charged particle tracking and imaging using standard VLSI CMOS technology;Turchetta;Nucl. Instrum. Methods Phys. Res. A,2001
2. Active pixel sensor array as a detector for electron microscopy;Milazzo;Ultramicroscopy,2005
3. Direct single electron detection with a CMOS detector for electron microscopy;Faruqi;Nucl. Instrum. Methods Phys. Res. A,2005
4. A high sensitivity imaging detector for electron microscopy;Faruqi;Nucl. Instrum. Methods Phys. Res. A,1995
5. A rad-hard CMOS active pixel sensor for electron microscopy;Battaglia;Nucl. Instrum. Methods Phys. Res. A,2009
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1. Toward the Development of High-Performance Direct Electron Detectors by Means of TCAD Simulations;IEEE Transactions on Electron Devices;2024-04
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