Control of the higher eigenmodes of a microcantilever: Applications in atomic force microscopy
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference45 articles.
1. Atomic Force Microscope
2. Fractured polymer/silica fiber surface studied by tapping mode atomic force microscopy
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2. Chaos control of an atomic force microscopy model in fractional-order;The European Physical Journal Special Topics;2021-07-26
3. Manipulating the frequency response of small high-frequency atomic force microscope cantilevers;Measurement Science and Technology;2020-06-22
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5. Time Delayed Feedback Control Applied in an Atomic Force Microscopy (AFM) Model in Fractional-Order;Journal of Vibration Engineering & Technologies;2019-08-14
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