A high-eigenfrequency differential stiffness probe for high-speed scanning probe microscopy
Author:
Affiliation:
1. Department of Mechanical Engineering, Indian Institute of Information Technology Design and Manufacturing Kurnool, Kurnool 518008, India
2. Department of Mechanical Engineering, Indian Institute of Technology Bombay, Mumbai 400076, India
Abstract
Publisher
The Royal Society
Subject
General Physics and Astronomy,General Engineering,General Mathematics
Link
https://royalsocietypublishing.org/doi/pdf/10.1098/rspa.2023.0001
Reference26 articles.
1. High-speed atomic force microscopy and its future prospects
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3. Modelling oscillatory flexure modes of an atomic force microscope cantilever in contact mode whilst imaging at high speed
4. Imaging modes of atomic force microscopy for application in molecular and cell biology
5. Faster high-speed atomic force microscopy for imaging of biomolecular processes
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