Minimizing electrostatic charging of an aperture used to produce in-focus phase contrast in the TEM-Reference-Cited by-同舟云学术

Minimizing electrostatic charging of an aperture used to produce in-focus phase contrast in the TEM

Published:2013-12 Issue: Volume:135 Page:6-15
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Glaeser Robert M.,Sassolini Simone,Cambie Rossana,Jin Jian,Cabrini Stefano,Schmid Andreas K.,Danev Radostin,Buijsse Bart,Csencsits Roseann,Downing Kenneth H.,Larson David M.,Typke Dieter,Han B.G.

Funder

NIH

LBNL Molecular Foundry

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference31 articles.

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3. Optimizing phase contrast in transmission electron microscopy with an electrostatic (Boersch) phase plate;Majorovits;Ultramicroscopy,2007

4. Imaging of soft and hard materials using a Boersch phase plate in a transmission electron microscope;Alloyeau;Ultramicroscopy,2010

5. Characterisation of ferromagnetic rings for Zernike phase plates using the Aharonov–Bohm effect;Edgcombe;Ultramicroscopy,2012

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