Correction of nonlinear lateral distortions of scanning probe microscopy images-Reference-Cited by-同舟云学术

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Correction of nonlinear lateral distortions of scanning probe microscopy images

Published:2014-01 Issue: Volume:136 Page:86-90
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Schnedler M.,Weidlich P.H.,Portz V.,Weber D.,Dunin-Borkowski R.E.,Ebert Ph.

Funder

new Omicron VT-STM, and the DFG

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference18 articles.

1. Springer Handbook of Experimental Solid Mechanics;William,2008

2. Single‐tube three‐dimensional scanner for scanning tunneling microscopy

3. Modeling hysteresis in piezoceramic actuators

4. Optical scan‐correction system applied to atomic force microscopy

5. Accurate topographic images using a measuring atomic force microscope

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1. Wavefront distortion correction in scanning tunneling microscope image;Review of Scientific Instruments;2024-05-01

2. Scanning transmission electron microscopy for advanced characterization of ferroic materials;Microstructures;2023-10-16

3. An accuracy improvement method for the topology measurement of an atomic force microscope using a 2D wavelet transform;Ultramicroscopy;2018-05

4. Single-Cell Optical Distortion Correction and Label-Free 3D Cell Shape Reconstruction on Lattices of Nanostructures;Nano Letters;2017-12-04

5. Strain and compositional fluctuations in Al0.81In0.19N/GaN heterostructures;Applied Physics Letters;2016-09-26

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