An accuracy improvement method for the topology measurement of an atomic force microscope using a 2D wavelet transform-Reference-Cited by-同舟云学术

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An accuracy improvement method for the topology measurement of an atomic force microscope using a 2D wavelet transform

Published:2018-05 Issue: Volume:188 Page:70-76
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Yoon Yeomin,Noh Suwoo,Jeong Jiseong,Park Kyihwan

Funder

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference14 articles.

1. Biological applications of the AFM: from single molecules to organs;Kasas;Int. J. Imag. Syst. Technol.,1997

2. 282-nm AlGaN-based deep ultraviolet light-emitting diodes with improved performance on nano-patterned sapphire substrates;Dong;Appl. Phys. Lett.,2013

3. Characteristic enhancement of the blue LED chip by the growth and fabrication on patterned sapphire (0001) substrate;Jeong;J. Crystal Growth,2010

4. Calibration of height in atomic force microscope images with subnanometer scale silicon dioxide steps;Ohmi;Appl. Phys. Lett.,1992

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2. Adsorption, Stretching, and Breaking Processes in Single‐Molecule Conductance of para ‐Benzenedimethanethiol in Gold Nanogaps: A DFT‐NEGF Theoretical Study**;ChemElectroChem;2021-03-12

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