StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images-Reference-Cited by-同舟云学术

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StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images

Published:2016-12 Issue: Volume:171 Page:104-116
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

De Backer A.,van den Bos K.H.W.,Van den Broek W.,Sijbers J.,Van Aert S.

Funder

Research Foundation Flanders

European Union Seventh Framework Programme

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference48 articles.

1. Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part I: A theoretical framework;den Dekker;Ultramicroscopy,2005

2. Maximum likelihood estimation of structure parameters from high resolution electron microscopy images: Part II: A practical example;Van Aert;Ultramicroscopy,2005

3. High-resolution electron microscopy;Van Dyck;Adv. Imaging Electron Phys.,2002

4. Scanning transmission electron microscopy;Nellist,2007

5. Statistical estimation of atomic positions from exit wave reconstruction with a precision in the picometer range;Bals;Phys. Rev. Lett.,2006

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