Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part I: A theoretical framework
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference52 articles.
1. S. Van Aert, A.J. den Dekker, A. van den Bos, D. Van Dyck, J.H. Chen, Maximum likelihood estimation of structure parameters from high resolution electron microscopy images, part II: a practical example, Ultramicroscopy, this issue, 2005, doi:10.1016/j.ultramic.2005.03.002.
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