Elastic and inelastic mean free paths of 200 keV electrons in metallic glasses-Reference-Cited by-同舟云学术

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Elastic and inelastic mean free paths of 200 keV electrons in metallic glasses

Published:2016-12 Issue: Volume:171 Page:89-95
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Zhang Pei,Wang Zhe,Perepezko J.H.,Voyles P.M.

Funder

National Science Foundation

Army Research Office

NSF

ARO

Case Western Reserve University

University of Wisconsin-Madison

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference27 articles.

1. A quantitative measure of medium-range order in amorphous materials from transmission electron micrographs;Dash;J. Phys. Condens. Matter,2003

2. Variable resolution fluctuation electron microscopy on Cu-Zr metallic glass using a wide range of coherent STEM probe size;Hwang;Microsc. Microanal.,2011

3. Medium-range structure and glass forming ability in Zr-Cu-Al bulk metallic glasses;Zhang;Acta Mater.,2016

4. Absence of an abrupt phase change from polycrystalline to amorphous in silicon with deposition temperature;Voyles;Phys. Rev. Lett.,2001

5. Effect of sample thickness, energy filtering, and probe coherence on fluctuation electron microscopy experiments;Yi;Ultramicroscopy,2011

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