Experimental evidence concerning the significant information depth of electron backscatter diffraction (EBSD)-Reference-Cited by-同舟云学术

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Experimental evidence concerning the significant information depth of electron backscatter diffraction (EBSD)

Published:2017-02 Issue: Volume:173 Page:1-9
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Wisniewski Wolfgang,Saager Stefan,Böbenroth Andrea,Rüssel Christian

Funder

Deutsche Forschungsgemeinschaft

European Union

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference39 articles.

1. An experimental viewpoint on the information depth of EBSD;Wisniewski;Scanning,2016

2. Progressive steps in the development of electron backscatter diffraction and orientation imaging microscopy;Dingley;J. Microsc.,2004

3. Electron energy loss and diffraction of backscattered electrons from silicon;Winkelmann;New J. Phys.,2010

4. Energy-filtered electron backscatter diffraction;Deal;Ultramicroscopy,2008

5. Digital direct electron imaging of energy-filtered electron backscatter diffraction patterns;Vespucci;Phys. Rev. B,2015

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