Digital direct electron imaging of energy-filtered electron backscatter diffraction patterns-Reference-Cited by-同舟云学术

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Digital direct electron imaging of energy-filtered electron backscatter diffraction patterns

Published:2015-11-06 Issue:20 Volume:92 Page:
ISSN:1098-0121
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Vespucci S.,Winkelmann A.,Naresh-Kumar G.,Mingard K. P.,Maneuski D.,Edwards P. R.,Day A. P.,O'Shea V.,Trager-Cowan C.

Funder

Engineering and Physical Sciences Research Council

Publisher

American Physical Society (APS)

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.92.205301/fulltext

Reference37 articles.

1. Scanning Electron Microscopy and X-ray Microanalysis

2. Advances in SEM-based diffraction studies of defects and strains in semiconductors

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