Dynamic modeling and sensitivity analysis of dAFM in the transient and steady state motions
Author:
Funder
Instituto de Ciencia de Materiales de Madrid
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
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1. Attractive and repulsive tip-sample interaction regimes in tapping-mode atomic force microscopy
2. Relationship between phase shift and energy dissipation in tapping-mode scanning force microscopy
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4. Phase contrast and surface energy hysteresis in tapping mode scanning force microsopy
5. Dynamics of a vibrating tip near or in intermittent contact with a surface
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