Author:
Mangipudi K.R.,Radisch V.,Holzer L.,Volkert C.A.
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference26 articles.
1. L. Holzer, M. Cantoni, Review of FIB-tomography, in: Nanofabrication Using Focused Ion and Electron Beams: Principles and Applications, Oxford Series in Nanomanufacturing, Oxford University Press, USA, 2012, pp. 410–435.
2. High-resolution three-dimensional reconstruction;Bansal;J. Vac. Sci. Technol. B,2006
3. Automated three-dimensional X-ray analysis using a dual-beam {FIB};Schaffer;Ultramicroscopy,2007
4. Investigation of slice thickness and shape milled by a focused ion beam for three-dimensional reconstruction of microstructures;Jones;Ultramicroscopy,2014
5. 3D microstructural characterization of nickel superalloys via serial-sectioning using a dual beam FIB-SEM;Uchic;Scr. Mater.,2006
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