Efficient phase contrast imaging in STEM using a pixelated detector. Part II: Optimisation of imaging conditions-Reference-Cited by-同舟云学术

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Efficient phase contrast imaging in STEM using a pixelated detector. Part II: Optimisation of imaging conditions

Published:2015-04 Issue: Volume:151 Page:232-239
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Yang Hao,Pennycook Timothy J.,Nellist Peter D.

Funder

EPSRC

European Union Seventh Framework Programme

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference22 articles.

1. T.J. Pennycook, A.R. Lupini, H. Yang, M.F. Murfitt, L. Jones, P.D. Nellist, Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution, Ultramicroscopy. http://dx.doi.org/10.1016/j.ultramic.2014.09.013, in press.

2. Experimental tests on double-resolution coherent imaging via STEM;Rodenburg;Ultramicroscopy,1993

3. High-resolution scanning x-ray diffraction microscopy;Thibault;Science,2008

4. Ptychographic electron microscopy using high-angle dark-field scattering for sub-nanometre resolution imaging;Humphry;Nat. Commun.,2012

5. An improved ptychographical phase retrieval algorithm for diffractive imaging;Maiden;Ultramicroscopy,2009

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