In lens BSE detector with energy filtering
Author:
Funder
TA CR
MEYS
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference13 articles.
1. Scanning Electron Microscopy: Physics of Image Formation and Microanalysis;Reimer,1998
2. High-resolution scanning electron microscopy;Joy;Ultramicroscopy,1992
3. Low voltage high-resolution sem for biological structural and molecular analysis;Schatten;Micron,2011
4. Scanning low-energy electron microscopy;Mullerova;Adva. Imaging Electron Phys.,2003
5. High-resolution, low-voltage SEM for true surface Imaging and Analysis;JAKSCH;Fresenius J. Anal. Chem.,1995
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