The Čerenkov limit of Si, GaAs and GaP in electron energy loss spectrometry
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference17 articles.
1. Berechnung der Energieverluste schneller Elektronen in dünnen Schichten mit Retardierung
2. Treating retardation effects in valence EELS spectra for Kramers–Kronig analysis
3. Optical properties and bandgaps from low loss EELS: Pitfalls and solutions
4. Low voltage TEM: Influences on electron energy loss spectrometry experiments
5. Transmission electron microscopy at 20kV for imaging and spectroscopy
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