Double-tilt in situ TEM holder with multiple electrical contacts and its application in MEMS-based mechanical testing of nanomaterials-Reference-Cited by-同舟云学术

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Double-tilt in situ TEM holder with multiple electrical contacts and its application in MEMS-based mechanical testing of nanomaterials

Published:2015-09 Issue: Volume:156 Page:23-28
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Bernal Rodrigo A.,Ramachandramoorthy Rajaprakash,Espinosa Horacio D.

Funder

Army Research Office

National Science Foundation

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference22 articles.

1. In situ transmission electron microscopy;Ferreira;MRS Bull.,2008

2. In situ high-resolution transmission electron microscopy in the study of nanomaterials and properties;Howe;MRS Bull.,2008

3. Quantitative in situ mechanical testing in electron microscopes;Legros;MRS Bull.,2010

4. In situ TEM electromechanical testing of nanowires and nanotubes;Espinosa;Small,2012

5. Measurements of near-ultimate strength for multiwalled carbon nanotubes and irradiation-induced crosslinking improvements;Peng;Nat. Nanotechnol.,2008

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1. Parallel-beams magnetic actuator for in-situ transmission electron microscope observation of mechanical testing;Measurement Science and Technology;2024-08-06

2. Microfabricated double-tilt apparatus for transmission electron microscope imaging of atomic force microscope probe;Review of Scientific Instruments;2024-02-01

3. Microelectromechanical system for in situ quantitative testing of tension–compression asymmetry in nanostructures;Nanoscale Horizons;2024

4. In Situ TEM Characterization and Modulation for Phase Engineering of Nanomaterials;Chemical Reviews;2023-12-06

5. In situ TEM study from the perspective of holders;Microscopy;2023-11-21

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