High order phase contrast and source divergence in low energy electron microscopy-Reference-Cited by-同舟云学术

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High order phase contrast and source divergence in low energy electron microscopy

Published:2021-06 Issue: Volume:225 Page:113284
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Yu Lei,Wan Weishi,Yu Ka Man,Altman Michael,Tang Wen-Xin

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference30 articles.

1. Springer Handbook of Microscopy;Hawkes,2019

2. Surface Microscopy with Low Energy Electrons;Bauer,2014

3. Magnetic imaging with spin-polarized low-energy electron microscopy;Rougemaille;Eur. Phys. J. Appl. Phys.,2010

4. An analytical reflection and emission UHV surface electron microscope;Telieps;Ultramicroscopy,1985

5. Step line tension and step morphological evolution on the Si(111)(1×1)surface;Pang;Phys. Rev. B,2008

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