Site-specific plan-view TEM lamella preparation of pristine surfaces with a large field of view-Reference-Cited by-同舟云学术

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Site-specific plan-view TEM lamella preparation of pristine surfaces with a large field of view

Published:2021-09 Issue: Volume:228 Page:113320
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Meyer Tobias,Westphal Tobias^ORCID,Kressdorf Birte,Ross Ulrich^ORCID,Jooss Christian,Seibt Michael^ORCID

Funder

Deutsche Forschungsgemeinschaft

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference16 articles.

1. A review of focused ion beam milling techniques for tem specimen preparation;Giannuzzi;Micron,1999

2. Fib plan and side view cross-sectional tem sample preparation of nanostructures;Lenrick;Microsc. Microanal.,2014

3. Plan view tem sample preparation using the focused ion beam lift-out technique;Stevie,1998

4. Combined tripod polishing and fib method for preparing semiconductor plan view specimens;Anderson;MRS Online Proc. Libr. Arch.,1997

5. Fabrication of high quality plan-view tem specimens using the focused ion beam;O’Shea;Micron,2014

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Phase Transitions in a Perovskite Thin Film Studied by Environmental In Situ Heating Nano‐Beam Electron Diffraction;Small Methods;2021-07-28

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