X-ray analysis and mapping by wavelength dispersive X-ray spectroscopy in an electron microscope
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference27 articles.
1. Tutorial Review: X-ray Mapping in Electron-Beam Instruments
2. Improved quantification of grain boundary segregation by EDS in a dedicated STEM
3. Heterogeneity Assessment in Individual CaCO3−CaSO4 Particles Using Ultrathin Window Electron Probe X-ray Microanalysis
4. Electron-Excited Energy Dispersive X-Ray Spectrometry at High Speed and at High Resolution: Silicon Drift Detectors and Microcalorimeters
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