Electron spin resonance and optical characterization of defects in microcrystalline silicon-Reference-Cited by-同舟云学术

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Electron spin resonance and optical characterization of defects in microcrystalline silicon

Published:2000-05 Issue: Volume:266-269 Page:519-523
ISSN:0022-3093
Container-title:Journal of Non-Crystalline Solids
language:en
Short-container-title:Journal of Non-Crystalline Solids

Author:

Vaněček M.,Poruba A.,Remeš Z.,Rosa J.,Kamba S.,Vorlı́ček V.,Meier J.,Shah A.

Publisher

Elsevier BV

Subject

Materials Chemistry,Condensed Matter Physics,Ceramics and Composites,Electronic, Optical and Magnetic Materials

Reference15 articles.

1. Complete microcrystallinep‐i‐nsolar cell—Crystalline or amorphous cell behavior?

2. J. Meier, S. Dubail, R. Fluckiger, D. Fischer, H. Keppner, A. Shah, in: Proceedings of the First WCPSEC, 1994, p. 409

3. K. Yamamoto, T. Suzuki, M. Yoshimi, A. Nakajima, in: Proceedings of the 14th EPSEC, 1997, p. 1018

4. K. Saito, M. Sano, K. Matuda, T. Kondo, T. Nishimoto, K. Ogawa, I. Kajita, in: Proceedings of the Second WCPSEC, 1999, p. 351

5. E. Vallat-Sauvain, U. Kroll, J. Meier, N. Wyrsch, A. Shah, these Proceedings, p. 125

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