Current fluctuations in thin a-SiC:H films
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Condensed Matter Physics,Ceramics and Composites,Electronic, Optical and Magnetic Materials
Reference7 articles.
1. Composition of1fNoise in Metal-Insulator-Metal Tunnel Junctions
2. Discrete Resistance Switching in Submicrometer Silicon Inversion Layers: Individual Interface Traps and Low-Frequency (1f?) Noise
3. Low‐frequency noise and discrete charge trapping in small‐area tunnel junction dc SQUID’s
4. Random telegraphic noise in large area a-Si:H/a-Si1−xNx:H double barrier structures
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2. From two-dimensional to three-dimensional quantum dots;Physica E: Low-dimensional Systems and Nanostructures;2002-03
3. Mesoscopic Phenomena in a-Si Based Microstructures;physica status solidi (b);1998-01
4. 1/fnoise in amorphous siliconnipandpindiodes;Journal of Applied Physics;1995-04
5. Irregularities in current-voltage characteristics of hydrogenated-amorphous-silicon-based barrier structures: Resonant tunnelling against hopping and filamentary conduction through the barriers;Philosophical Magazine B;1994-11
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