Comparison of motif combination with mean line and envelope systems used for surface profile analysis-Reference-Cited by-同舟云学术

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Comparison of motif combination with mean line and envelope systems used for surface profile analysis

Published:1987-07 Issue:3 Volume:117 Page:335-345
ISSN:0043-1648
Container-title:Wear
language:en
Short-container-title:Wear

Author:

Shunmugam M.S.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Mechanics of Materials,Condensed Matter Physics

Reference10 articles.

1. Survey of reference lines in the assessment of surface texture;Whitehouse;Ann. CIRP,1972

2. Analysis of some of the reference lines used for measuring surface roughness;Radhakrishnan,1973

3. Surface texture;British Standard BS 1134–1961,1971

4. Improved type of wavefilter for use in surface finish measurements;Whitehouse,1967

5. Filtering of surface profiles using fast Fourier transform;Raja;Int. J. Mach. Tool Des. Res.,1979

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Correlating motif analysis and morphological filters for surface texture analysis;Measurement;2013-02

2. Three-Dimensional Characterization of Engineering Surfaces Using Triangular Motifs;Proceedings of the Institution of Mechanical Engineers, Part C: Journal of Mechanical Engineering Science;2005-09-01

3. Motif analysis for automatic segmentation of CT surface contours into individual surface features;Computer-Aided Design;2001-12

4. Caractérisation visuelle de l'altération d'échantillons carottés de pierre, vieillis en simulation dynamique aux brouillards salins;Materials and Structures;1999-10

5. The “Motifs” method: An interesting complement to ISO parameters for some functional problems;International Journal of Machine Tools and Manufacture;1992-02

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