Influence of misfit and threading dislocations on the surface morphology of SiGe graded-layers
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics
Reference14 articles.
1. E.P. Kvam et al., MRS Bulletin, vol. 104, 1987.
2. Generation of Misfit Dislocations in Si1-xGex/Si Heterostructures
3. Misfit Dislocation Structures at MBE-Grown Si1-xGex/Si Interfaces
4. Insitustudy of relaxation of SiGe thin films by the modified Frank–Read mechanism
5. A study of surface cross-hatch and misfit dislocation structure in grown by chemical beam epitaxy
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