Misfit Dislocation Structures at MBE-Grown Si1-xGex/Si Interfaces
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Cited by 28 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Tomographic Mapping Analysis in the Depth Direction of High-Ge-Content SiGe Layers with Compositionally Graded Buffers Using Nanobeam X-ray Diffraction;ACS Applied Materials & Interfaces;2017-04-10
2. Time-dependent nonlinear finite element modeling of the elastic and plastic deformation in SiGe heterostructured nanomaterials;Journal of Applied Physics;2017-01-14
3. Misfit dislocations induced by lithium-ion diffusion in a thin film anode;Journal of Solid State Electrochemistry;2016-09-05
4. SiGe nanostructures;Surface Science Reports;2009-02-28
5. Si/SiGe heterostructures for advanced microelectronic devices;Phase Transitions;2008-07
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